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Board and System Test (keyword)
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book article
Ways for board and system test to benefit from FPGA embedded instrumentation
Ehrenberg, Heiko
;
Odintsov, Sergei
;
Devadze, Sergei
;
Jutman, Artur
;
Aleksejev, Igor
;
Wenzel, Thomas
2019 IEEE AUTOTESTCON
2019
/
10 p : ill
https://doi.org/10.1109/AUTOTESTCON43700.2019.8961057
book article
Number of records 1, displaying
1 - 1
keyword
162
1.
Board and System Test
2.
board test
3.
processor-centric board test
4.
IEEE 9 bus test system
5.
system level test
6.
across-the-board cuts
7.
board
8.
board composition
9.
board diagnosis
10.
board diversity
11.
board of directors
12.
Estonian Police and Border Guard Board (PPA)
13.
laminate embedded printed circuit board
14.
off-board charger
15.
off-board charger (OBC)
16.
off-board chargers
17.
on-board charger (OBC)
18.
on-board chargers
19.
processor-centric board
20.
single board computer
21.
single-board computer
22.
accelerated shelf-life test
23.
adaptive test strategy generation
24.
antigen test
25.
Applications in Test Engineering
26.
ASTM G65 dry sand rubber wheel abrasion test
27.
Automated Synthesis of Software-based Self-test
28.
automated test environment
29.
automated test pattern generation
30.
automatic test case generation
31.
automatic test pattern generation
32.
automatic test program generation
33.
Auvergne test-bed
34.
battery test
35.
behavioral test
36.
behaviour level test generation
37.
bending test
38.
bit-error rate test
39.
bounds test
40.
built-in self-test
41.
capillary condensation redistribution test
42.
chi-square test
43.
closed bottle test
44.
cognitive screening test
45.
compartment fire test
46.
compartment test
47.
cone penetration test (CPT)
48.
COVID-19 antigen test
49.
cutting test
50.
cybersecurity test bed
51.
DDR4 interconnect test
52.
design and test
53.
design-for-test
54.
deterministic test sequences
55.
diagnostic test
56.
digital test
57.
Digital test and testable design
58.
double-pulse test
59.
drawing test
60.
dry droplet antimicrobial test
61.
Embedded figures test
62.
embedded test
63.
fan pressurisation test
64.
final test result prediction
65.
four-point bending test
66.
FPGA based test
67.
FPGA-Assisted Test
68.
FPGA-centric test
69.
functional self-test
70.
functional test generation
71.
Granger causality test
72.
hardness test
73.
Hierarchical Multi-level Test Generation
74.
high-level synthesis for test
75.
high-level test data generation
76.
highlevel test generation
77.
high-speed serial link test
78.
implementation-independent test generation
79.
in situ tensile test in SEM
80.
industrial field test
81.
in-situ tensile test in SEM
82.
Johansen cointegration test
83.
Kolmogorov-Smirnov test
84.
load test
85.
logic built-in self-test
86.
Luria alternating series test
87.
Mann–Kendall test
88.
Mann-Kendall trend test
89.
memory interconnect test
90.
microprocessor test
91.
Model test
92.
multiplier test
93.
offline test generation
94.
orthogonal test
95.
package test analysis
96.
parallel design and test
97.
performance test
98.
piezocone penetration test (CPTu)
99.
Point Load Test index
100.
pressurisation test
101.
progressive damage test
102.
Provably Correct Test Development
103.
provably correct test generation
104.
pseudo-exhaustive test
105.
purity test
106.
real-time room temperature test
107.
rolling thin film oven test
108.
rtioco-based timed test sequences
109.
seasonal Mann Kendall test
110.
seismic piezocone penetration test
111.
self-test
112.
self-test architectures
113.
sentence writing test
114.
serial sevens test
115.
ship towing test tank
116.
similar material simulation test
117.
small-scale fire test
118.
small‐scale test
119.
software based self-test
120.
software-based self-test
121.
software-based self-test (SBST)
122.
soil phosphorus (P) test
123.
standard test method
124.
static load test
125.
static-dynamic probing test (SDT)
126.
stress test
127.
teaching design and test of systems
128.
tensile test
129.
tensile test
130.
test
131.
Test Adapters
132.
test and evaluation platform
133.
test automation
134.
test bench
135.
test coverage
136.
test driven development
137.
test driven modelling
138.
test embankment
139.
test equipment
140.
test generation
141.
test generation and fault diagnosis
142.
Test Group Generation for Detecting Multiple Faults
143.
test groups
144.
test model design
145.
test optimization
146.
test packets
147.
test path synthesis
148.
test patterns
149.
test point insertion
150.
test program generation
151.
test reference year
152.
test replication
153.
test scenario description language
154.
test-bed
155.
test-chips
156.
test-house
157.
test-pattern
158.
test-suite reduction
159.
Three-point bending test
160.
unit root test
161.
usability platform test
162.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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