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1
book article
Dense components in the structure of WordNet
Lohk, Ahti
;
Orav, Heili
;
Allik, Kaarel
;
Võhandu, Leo
Proceedings of the Ninth International Conference on Language Resources and Evaluation (LREC'14) : May 26-31, 2014, Reykjavik, Iceland
2014
/
p. 1135-1139 : ill
book article
Number of records 1, displaying
1 - 1
keyword
152
1.
test-pattern
2.
automated test pattern generation
3.
automatic test pattern generation
4.
architecture pattern
5.
circulation pattern
6.
demand time pattern
7.
FP Growth (Frequent-Pattern Growth) algorithm
8.
Image Processing and Pattern Recognition
9.
interaction design pattern
10.
load pattern
11.
pattern
12.
pattern classification
13.
pattern enumeration
14.
pattern formation
15.
pattern Generation
16.
pattern language
17.
pattern matching
18.
pattern mining from event logs
19.
pattern mining from log files
20.
pattern recognition
21.
pattern search
22.
ripple pattern formation
23.
Single far-field pattern
24.
accelerated shelf-life test
25.
adaptive test strategy generation
26.
antigen test
27.
ASTM G65 dry sand rubber wheel abrasion test
28.
automated test environment
29.
automatic test case generation
30.
automatic test program generation
31.
Auvergne test-bed
32.
battery test
33.
behavioral test
34.
behaviour level test generation
35.
bending test
36.
bit-error rate test
37.
Board and System Test
38.
board test
39.
bounds test
40.
built-in self-test
41.
capillary condensation redistribution test
42.
chi-square test
43.
closed bottle test
44.
cognitive screening test
45.
compartment fire test
46.
compartment test
47.
cone penetration test (CPT)
48.
COVID-19 antigen test
49.
cutting test
50.
cybersecurity test bed
51.
DDR4 interconnect test
52.
design and test
53.
design-for-test
54.
deterministic test sequences
55.
diagnostic test
56.
digital test
57.
Digital test and testable design
58.
double-pulse test
59.
drawing test
60.
dry droplet antimicrobial test
61.
embedded test
62.
fan pressurisation test
63.
final test result prediction
64.
four-point bending test
65.
FPGA based test
66.
FPGA-Assisted Test
67.
FPGA-centric test
68.
functional self-test
69.
functional test generation
70.
Granger causality test
71.
hardness test
72.
high-level synthesis for test
73.
high-level test data generation
74.
highlevel test generation
75.
high-speed serial link test
76.
IEEE 9 bus test system
77.
implementation-independent test generation
78.
in situ tensile test in SEM
79.
industrial field test
80.
in-situ tensile test in SEM
81.
Johansen cointegration test
82.
Kolmogorov-Smirnov test
83.
load test
84.
logic built-in self-test
85.
Luria alternating series test
86.
Mann–Kendall test
87.
memory interconnect test
88.
microprocessor test
89.
Model test
90.
multiplier test
91.
offline test generation
92.
orthogonal test
93.
package test analysis
94.
parallel design and test
95.
performance test
96.
piezocone penetration test (CPTu)
97.
Point Load Test index
98.
pressurisation test
99.
processor-centric board test
100.
progressive damage test
101.
provably correct test generation
102.
pseudo-exhaustive test
103.
purity test
104.
rtioco-based timed test sequences
105.
seasonal Mann Kendall test
106.
seismic piezocone penetration test
107.
self-test
108.
self-test architectures
109.
sentence writing test
110.
serial sevens test
111.
ship towing test tank
112.
similar material simulation test
113.
small‐scale test
114.
software based self-test
115.
software-based self-test
116.
software-based self-test (SBST)
117.
soil phosphorus (P) test
118.
standard test method
119.
static load test
120.
static-dynamic probing test (SDT)
121.
stress test
122.
system level test
123.
teaching design and test of systems
124.
tensile test
125.
test
126.
test and evaluation platform
127.
test bench
128.
test coverage
129.
test driven development
130.
test driven modelling
131.
test embankment
132.
test equipment
133.
test generation
134.
test generation and fault diagnosis
135.
test groups
136.
test model design
137.
test optimization
138.
test packets
139.
test path synthesis
140.
test patterns
141.
test point insertion
142.
test program generation
143.
test reference year
144.
test replication
145.
test scenario description language
146.
test-bed
147.
test-chips
148.
test-house
149.
test-suite reduction
150.
Three-point bending test
151.
unit root test
152.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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