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1
book article
Dense components in the structure of WordNet
Lohk, Ahti
;
Orav, Heili
;
Allik, Kaarel
;
Võhandu, Leo
Proceedings of the Ninth International Conference on Language Resources and Evaluation (LREC'14) : May 26-31, 2014, Reykjavik, Iceland
2014
/
p. 1135-1139 : ill
book article
Number of records 1, displaying
1 - 1
keyword
168
1.
test-pattern
2.
automated test pattern generation
3.
automatic test pattern generation
4.
architecture pattern
5.
circulation pattern
6.
demand time pattern
7.
FP Growth (Frequent-Pattern Growth) algorithm
8.
Image Processing and Pattern Recognition
9.
interaction design pattern
10.
load pattern
11.
nocturnal nondipping pattern
12.
pattern
13.
pattern classification
14.
pattern enumeration
15.
pattern formation
16.
pattern Generation
17.
pattern language
18.
pattern matching
19.
pattern mining for event logs
20.
pattern mining from event logs
21.
pattern mining from log files
22.
pattern of life
23.
pattern recognition
24.
pattern search
25.
phase resolved partial discharge (PRPD) pattern
26.
radio frequency pattern matching
27.
ripple pattern formation
28.
Single far-field pattern
29.
accelerated shelf-life test
30.
adaptive test strategy generation
31.
antigen test
32.
Applications in Test Engineering
33.
ASTM G65 dry sand rubber wheel abrasion test
34.
Automated Synthesis of Software-based Self-test
35.
automated test environment
36.
automatic test case generation
37.
automatic test program generation
38.
Auvergne test-bed
39.
battery test
40.
behavioral test
41.
behaviour level test generation
42.
bending test
43.
bit-error rate test
44.
Board and System Test
45.
board test
46.
bounds test
47.
built-in self-test
48.
capillary condensation redistribution test
49.
chi-square test
50.
closed bottle test
51.
cognitive screening test
52.
compartment fire test
53.
compartment test
54.
cone penetration test (CPT)
55.
COVID-19 antigen test
56.
cutting test
57.
cybersecurity test bed
58.
DDR4 interconnect test
59.
design and test
60.
design-for-test
61.
deterministic test sequences
62.
diagnostic test
63.
digital test
64.
Digital test and testable design
65.
double-pulse test
66.
drawing test
67.
dry droplet antimicrobial test
68.
embedded test
69.
fan pressurisation test
70.
final test result prediction
71.
four-point bending test
72.
FPGA based test
73.
FPGA-Assisted Test
74.
FPGA-centric test
75.
functional self-test
76.
functional test generation
77.
Granger causality test
78.
hardness test
79.
Hierarchical Multi-level Test Generation
80.
high-level synthesis for test
81.
high-level test data generation
82.
highlevel test generation
83.
high-speed serial link test
84.
IEEE 9 bus test system
85.
implementation-independent test generation
86.
in situ tensile test in SEM
87.
industrial field test
88.
in-situ tensile test in SEM
89.
Johansen cointegration test
90.
Kolmogorov-Smirnov test
91.
load test
92.
logic built-in self-test
93.
Luria alternating series test
94.
Mann–Kendall test
95.
Mann-Kendall trend test
96.
memory interconnect test
97.
microprocessor test
98.
Model test
99.
multiplier test
100.
offline test generation
101.
orthogonal test
102.
package test analysis
103.
parallel design and test
104.
performance test
105.
piezocone penetration test (CPTu)
106.
Point Load Test index
107.
pressurisation test
108.
processor-centric board test
109.
progressive damage test
110.
provably correct test generation
111.
pseudo-exhaustive test
112.
purity test
113.
real-time room temperature test
114.
rolling thin film oven test
115.
rtioco-based timed test sequences
116.
seasonal Mann Kendall test
117.
seismic piezocone penetration test
118.
self-test
119.
self-test architectures
120.
sentence writing test
121.
serial sevens test
122.
ship towing test tank
123.
similar material simulation test
124.
small-scale fire test
125.
small‐scale test
126.
software based self-test
127.
software-based self-test
128.
software-based self-test (SBST)
129.
soil phosphorus (P) test
130.
standard test method
131.
static load test
132.
static-dynamic probing test (SDT)
133.
stress test
134.
system level test
135.
teaching design and test of systems
136.
tensile test
137.
tensile test
138.
test
139.
test and evaluation platform
140.
test automation
141.
test bench
142.
test coverage
143.
test driven development
144.
test driven modelling
145.
test embankment
146.
test equipment
147.
test generation
148.
test generation and fault diagnosis
149.
Test Group Generation for Detecting Multiple Faults
150.
test groups
151.
test model design
152.
test optimization
153.
test packets
154.
test path synthesis
155.
test patterns
156.
test point insertion
157.
test program generation
158.
test reference year
159.
test replication
160.
test scenario description language
161.
test-bed
162.
test-chips
163.
test-house
164.
test-suite reduction
165.
Three-point bending test
166.
unit root test
167.
usability platform test
168.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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