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book article EST
/
book article ENG
Aspect-oriented Model-based testing with UPPAAL timed automata
Vain, Jüri
;
Tsiopoulos, Leonidas
;
Kanter, Gert
Model and Data Engineering : 10th International Conference, MEDI 2021, Tallinn, Estonia, June 21–23, 2021 : proceedings
2021
/
p. 117-124
https://doi.org/10.1007/978-3-030-78428-7_10
Conference Proceedings at Scopus
Article at Scopus
book article EST
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book article ENG
Number of records 1, displaying
1 - 1
keyword
157
1.
test coverage
2.
code coverage
3.
code-coverage
4.
conceptual coverage
5.
coverage
6.
coverage factor
7.
diagnostic coverage
8.
fault coverage
9.
gaps in coverage
10.
high-level fault coverage
11.
insurance coverage
12.
NB-IoT coverage
13.
Security Coverage
14.
stress coverage
15.
5G coverage
16.
accelerated shelf-life test
17.
adaptive test strategy generation
18.
antigen test
19.
Applications in Test Engineering
20.
ASTM G65 dry sand rubber wheel abrasion test
21.
Automated Synthesis of Software-based Self-test
22.
automated test environment
23.
automated test pattern generation
24.
automatic test case generation
25.
automatic test pattern generation
26.
automatic test program generation
27.
Auvergne test-bed
28.
battery test
29.
behavioral test
30.
behaviour level test generation
31.
bending test
32.
bit-error rate test
33.
Board and System Test
34.
board test
35.
bounds test
36.
built-in self-test
37.
capillary condensation redistribution test
38.
chi-square test
39.
closed bottle test
40.
cognitive screening test
41.
compartment fire test
42.
compartment test
43.
cone penetration test (CPT)
44.
COVID-19 antigen test
45.
cutting test
46.
cybersecurity test bed
47.
DDR4 interconnect test
48.
design and test
49.
design-for-test
50.
deterministic test sequences
51.
diagnostic test
52.
digital test
53.
Digital test and testable design
54.
double-pulse test
55.
drawing test
56.
dry droplet antimicrobial test
57.
embedded test
58.
fan pressurisation test
59.
final test result prediction
60.
four-point bending test
61.
FPGA based test
62.
FPGA-Assisted Test
63.
FPGA-centric test
64.
functional self-test
65.
functional test generation
66.
Granger causality test
67.
hardness test
68.
Hierarchical Multi-level Test Generation
69.
high-level synthesis for test
70.
high-level test data generation
71.
highlevel test generation
72.
high-speed serial link test
73.
IEEE 9 bus test system
74.
implementation-independent test generation
75.
in situ tensile test in SEM
76.
industrial field test
77.
in-situ tensile test in SEM
78.
Johansen cointegration test
79.
Kolmogorov-Smirnov test
80.
load test
81.
logic built-in self-test
82.
Luria alternating series test
83.
Mann–Kendall test
84.
Mann-Kendall trend test
85.
memory interconnect test
86.
microprocessor test
87.
Model test
88.
multiplier test
89.
offline test generation
90.
orthogonal test
91.
package test analysis
92.
parallel design and test
93.
performance test
94.
piezocone penetration test (CPTu)
95.
Point Load Test index
96.
pressurisation test
97.
processor-centric board test
98.
progressive damage test
99.
provably correct test generation
100.
pseudo-exhaustive test
101.
purity test
102.
real-time room temperature test
103.
rolling thin film oven test
104.
rtioco-based timed test sequences
105.
seasonal Mann Kendall test
106.
seismic piezocone penetration test
107.
self-test
108.
self-test architectures
109.
sentence writing test
110.
serial sevens test
111.
ship towing test tank
112.
similar material simulation test
113.
small-scale fire test
114.
small‐scale test
115.
software based self-test
116.
software-based self-test
117.
software-based self-test (SBST)
118.
soil phosphorus (P) test
119.
standard test method
120.
static load test
121.
static-dynamic probing test (SDT)
122.
stress test
123.
system level test
124.
teaching design and test of systems
125.
tensile test
126.
tensile test
127.
test
128.
test and evaluation platform
129.
test automation
130.
test bench
131.
test driven development
132.
test driven modelling
133.
test embankment
134.
test equipment
135.
test generation
136.
test generation and fault diagnosis
137.
Test Group Generation for Detecting Multiple Faults
138.
test groups
139.
test model design
140.
test optimization
141.
test packets
142.
test path synthesis
143.
test patterns
144.
test point insertion
145.
test program generation
146.
test reference year
147.
test replication
148.
test scenario description language
149.
test-bed
150.
test-chips
151.
test-house
152.
test-pattern
153.
test-suite reduction
154.
Three-point bending test
155.
unit root test
156.
usability platform test
157.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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