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book article EST
/
book article ENG
Aspect-oriented Model-based testing with UPPAAL timed automata
Vain, Jüri
;
Tsiopoulos, Leonidas
;
Kanter, Gert
Model and Data Engineering : 10th International Conference, MEDI 2021, Tallinn, Estonia, June 21–23, 2021 : proceedings
2021
/
p. 117-124
https://doi.org/10.1007/978-3-030-78428-7_10
Conference Proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
Number of records 1, displaying
1 - 1
keyword
146
1.
test coverage
2.
code coverage
3.
code-coverage
4.
conceptual coverage
5.
coverage
6.
coverage factor
7.
diagnostic coverage
8.
fault coverage
9.
gaps in coverage
10.
high-level fault coverage
11.
insurance coverage
12.
NB-IoT coverage
13.
Security Coverage
14.
stress coverage
15.
5G coverage
16.
accelerated shelf-life test
17.
adaptive test strategy generation
18.
antigen test
19.
ASTM G65 dry sand rubber wheel abrasion test
20.
automated test environment
21.
automated test pattern generation
22.
automatic test case generation
23.
automatic test pattern generation
24.
automatic test program generation
25.
Auvergne test-bed
26.
battery test
27.
behavioral test
28.
behaviour level test generation
29.
bending test
30.
bit-error rate test
31.
Board and System Test
32.
board test
33.
bounds test
34.
built-in self-test
35.
capillary condensation redistribution test
36.
chi-square test
37.
closed bottle test
38.
cognitive screening test
39.
compartment fire test
40.
compartment test
41.
cone penetration test (CPT)
42.
COVID-19 antigen test
43.
cutting test
44.
cybersecurity test bed
45.
DDR4 interconnect test
46.
design and test
47.
design-for-test
48.
deterministic test sequences
49.
diagnostic test
50.
digital test
51.
Digital test and testable design
52.
double-pulse test
53.
drawing test
54.
dry droplet antimicrobial test
55.
embedded test
56.
fan pressurisation test
57.
final test result prediction
58.
four-point bending test
59.
FPGA based test
60.
FPGA-Assisted Test
61.
FPGA-centric test
62.
functional self-test
63.
functional test generation
64.
Granger causality test
65.
hardness test
66.
high-level synthesis for test
67.
high-level test data generation
68.
highlevel test generation
69.
high-speed serial link test
70.
IEEE 9 bus test system
71.
implementation-independent test generation
72.
in situ tensile test in SEM
73.
industrial field test
74.
in-situ tensile test in SEM
75.
Johansen cointegration test
76.
Kolmogorov-Smirnov test
77.
load test
78.
logic built-in self-test
79.
Luria alternating series test
80.
Mann–Kendall test
81.
memory interconnect test
82.
microprocessor test
83.
Model test
84.
multiplier test
85.
offline test generation
86.
orthogonal test
87.
package test analysis
88.
parallel design and test
89.
performance test
90.
piezocone penetration test (CPTu)
91.
Point Load Test index
92.
pressurisation test
93.
processor-centric board test
94.
progressive damage test
95.
provably correct test generation
96.
pseudo-exhaustive test
97.
purity test
98.
rtioco-based timed test sequences
99.
seasonal Mann Kendall test
100.
seismic piezocone penetration test
101.
self-test
102.
self-test architectures
103.
sentence writing test
104.
serial sevens test
105.
ship towing test tank
106.
similar material simulation test
107.
small‐scale test
108.
software based self-test
109.
software-based self-test
110.
software-based self-test (SBST)
111.
soil phosphorus (P) test
112.
standard test method
113.
static load test
114.
static-dynamic probing test (SDT)
115.
stress test
116.
system level test
117.
teaching design and test of systems
118.
tensile test
119.
test
120.
test and evaluation platform
121.
test bench
122.
test driven development
123.
test driven modelling
124.
test embankment
125.
test equipment
126.
test generation
127.
test generation and fault diagnosis
128.
test groups
129.
test model design
130.
test optimization
131.
test packets
132.
test path synthesis
133.
test patterns
134.
test point insertion
135.
test program generation
136.
test reference year
137.
test replication
138.
test scenario description language
139.
test-bed
140.
test-chips
141.
test-house
142.
test-pattern
143.
test-suite reduction
144.
Three-point bending test
145.
unit root test
146.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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