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test replication (keyword)
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book article
Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cells
Azad, Siavoosh Payandeh
;
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings
2018
/
p. 21-26 : ill
https://doi.org/10.1109/DDECS.2018.00011
book article
Number of records 1, displaying
1 - 1
keyword
136
1.
test replication
2.
DNA replication
3.
replication
4.
RNA replication
5.
virus replication
6.
accelerated shelf-life test
7.
adaptive test strategy generation
8.
antigen test
9.
ASTM G65 dry sand rubber wheel abrasion test
10.
automated test environment
11.
automated test pattern generation
12.
automatic test case generation
13.
automatic test pattern generation
14.
automatic test program generation
15.
Auvergne test-bed
16.
battery test
17.
behavioral test
18.
behaviour level test generation
19.
bending test
20.
bit-error rate test
21.
Board and System Test
22.
board test
23.
bounds test
24.
built-in self-test
25.
capillary condensation redistribution test
26.
chi-square test
27.
closed bottle test
28.
cognitive screening test
29.
compartment fire test
30.
compartment test
31.
cone penetration test (CPT)
32.
COVID-19 antigen test
33.
cutting test
34.
cybersecurity test bed
35.
DDR4 interconnect test
36.
design and test
37.
design-for-test
38.
deterministic test sequences
39.
diagnostic test
40.
digital test
41.
Digital test and testable design
42.
double-pulse test
43.
drawing test
44.
dry droplet antimicrobial test
45.
embedded test
46.
fan pressurisation test
47.
final test result prediction
48.
four-point bending test
49.
FPGA based test
50.
FPGA-Assisted Test
51.
FPGA-centric test
52.
functional self-test
53.
functional test generation
54.
Granger causality test
55.
hardness test
56.
high-level synthesis for test
57.
high-level test data generation
58.
highlevel test generation
59.
high-speed serial link test
60.
IEEE 9 bus test system
61.
implementation-independent test generation
62.
in situ tensile test in SEM
63.
industrial field test
64.
in-situ tensile test in SEM
65.
Johansen cointegration test
66.
Kolmogorov-Smirnov test
67.
load test
68.
logic built-in self-test
69.
Luria alternating series test
70.
Mann–Kendall test
71.
memory interconnect test
72.
microprocessor test
73.
Model test
74.
multiplier test
75.
offline test generation
76.
orthogonal test
77.
package test analysis
78.
parallel design and test
79.
performance test
80.
piezocone penetration test (CPTu)
81.
Point Load Test index
82.
pressurisation test
83.
processor-centric board test
84.
progressive damage test
85.
provably correct test generation
86.
pseudo-exhaustive test
87.
purity test
88.
rtioco-based timed test sequences
89.
seasonal Mann Kendall test
90.
seismic piezocone penetration test
91.
self-test
92.
self-test architectures
93.
sentence writing test
94.
serial sevens test
95.
ship towing test tank
96.
similar material simulation test
97.
small‐scale test
98.
software based self-test
99.
software-based self-test
100.
software-based self-test (SBST)
101.
soil phosphorus (P) test
102.
standard test method
103.
static load test
104.
static-dynamic probing test (SDT)
105.
stress test
106.
system level test
107.
teaching design and test of systems
108.
tensile test
109.
test
110.
test and evaluation platform
111.
test bench
112.
test coverage
113.
test driven development
114.
test driven modelling
115.
test embankment
116.
test equipment
117.
test generation
118.
test generation and fault diagnosis
119.
test groups
120.
test model design
121.
test optimization
122.
test packets
123.
test path synthesis
124.
test patterns
125.
test point insertion
126.
test program generation
127.
test reference year
128.
test scenario description language
129.
test-bed
130.
test-chips
131.
test-house
132.
test-pattern
133.
test-suite reduction
134.
Three-point bending test
135.
unit root test
136.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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