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book article
Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cells
Azad, Siavoosh Payandeh
;
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings
2018
/
p. 21-26 : ill
https://doi.org/10.1109/DDECS.2018.00011
book article
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keyword
147
1.
test replication
2.
DNA replication
3.
replication
4.
RNA replication
5.
virus replication
6.
accelerated shelf-life test
7.
adaptive test strategy generation
8.
antigen test
9.
Applications in Test Engineering
10.
ASTM G65 dry sand rubber wheel abrasion test
11.
Automated Synthesis of Software-based Self-test
12.
automated test environment
13.
automated test pattern generation
14.
automatic test case generation
15.
automatic test pattern generation
16.
automatic test program generation
17.
Auvergne test-bed
18.
battery test
19.
behavioral test
20.
behaviour level test generation
21.
bending test
22.
bit-error rate test
23.
Board and System Test
24.
board test
25.
bounds test
26.
built-in self-test
27.
capillary condensation redistribution test
28.
chi-square test
29.
closed bottle test
30.
cognitive screening test
31.
compartment fire test
32.
compartment test
33.
cone penetration test (CPT)
34.
COVID-19 antigen test
35.
cutting test
36.
cybersecurity test bed
37.
DDR4 interconnect test
38.
design and test
39.
design-for-test
40.
deterministic test sequences
41.
diagnostic test
42.
digital test
43.
Digital test and testable design
44.
double-pulse test
45.
drawing test
46.
dry droplet antimicrobial test
47.
embedded test
48.
fan pressurisation test
49.
final test result prediction
50.
four-point bending test
51.
FPGA based test
52.
FPGA-Assisted Test
53.
FPGA-centric test
54.
functional self-test
55.
functional test generation
56.
Granger causality test
57.
hardness test
58.
Hierarchical Multi-level Test Generation
59.
high-level synthesis for test
60.
high-level test data generation
61.
highlevel test generation
62.
high-speed serial link test
63.
IEEE 9 bus test system
64.
implementation-independent test generation
65.
in situ tensile test in SEM
66.
industrial field test
67.
in-situ tensile test in SEM
68.
Johansen cointegration test
69.
Kolmogorov-Smirnov test
70.
load test
71.
logic built-in self-test
72.
Luria alternating series test
73.
Mann–Kendall test
74.
Mann-Kendall trend test
75.
memory interconnect test
76.
microprocessor test
77.
Model test
78.
multiplier test
79.
offline test generation
80.
orthogonal test
81.
package test analysis
82.
parallel design and test
83.
performance test
84.
piezocone penetration test (CPTu)
85.
Point Load Test index
86.
pressurisation test
87.
processor-centric board test
88.
progressive damage test
89.
provably correct test generation
90.
pseudo-exhaustive test
91.
purity test
92.
real-time room temperature test
93.
rolling thin film oven test
94.
rtioco-based timed test sequences
95.
seasonal Mann Kendall test
96.
seismic piezocone penetration test
97.
self-test
98.
self-test architectures
99.
sentence writing test
100.
serial sevens test
101.
ship towing test tank
102.
similar material simulation test
103.
small-scale fire test
104.
small‐scale test
105.
software based self-test
106.
software-based self-test
107.
software-based self-test (SBST)
108.
soil phosphorus (P) test
109.
standard test method
110.
static load test
111.
static-dynamic probing test (SDT)
112.
stress test
113.
system level test
114.
teaching design and test of systems
115.
tensile test
116.
tensile test
117.
test
118.
test and evaluation platform
119.
test automation
120.
test bench
121.
test coverage
122.
test driven development
123.
test driven modelling
124.
test embankment
125.
test equipment
126.
test generation
127.
test generation and fault diagnosis
128.
Test Group Generation for Detecting Multiple Faults
129.
test groups
130.
test model design
131.
test optimization
132.
test packets
133.
test path synthesis
134.
test patterns
135.
test point insertion
136.
test program generation
137.
test reference year
138.
test scenario description language
139.
test-bed
140.
test-chips
141.
test-house
142.
test-pattern
143.
test-suite reduction
144.
Three-point bending test
145.
unit root test
146.
usability platform test
147.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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