Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Advanced search
My bookmarks
0
test-chips (keyword)
All fields
Source search
Author search
Subject term search
Title search
source
author
DOI
year of publication
location of publication
supervisor
category
publisher
classifier
conference location
quartile
availibility
subject term
title
series
name of the person
TTÜ subject term
TTÜ department
url
keyword
All fields
author
co-contibutor
commentator
compiler
corporate author
editor
expert
interviewer
supervisor
translator
series variant title
title
translation of title
variant title
source
special issue
name of the institution
subject of form
subject of location
subject of time
subject term
series
series variant title
availibility
Open Access
category (general)
category (sub)
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
source
author
DOI
year of publication
location of publication
supervisor
category
publisher
classifier
conference location
quartile
availibility
subject term
title
series
name of the person
TTÜ subject term
TTÜ department
url
keyword
All fields
author
co-contibutor
commentator
compiler
corporate author
editor
expert
interviewer
supervisor
translator
series variant title
title
translation of title
variant title
source
special issue
name of the institution
subject of form
subject of location
subject of time
subject term
series
series variant title
availibility
Open Access
category (general)
category (sub)
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
source
author
DOI
year of publication
location of publication
supervisor
category
publisher
classifier
conference location
quartile
availibility
subject term
title
series
name of the person
TTÜ subject term
TTÜ department
url
keyword
All fields
author
co-contibutor
commentator
compiler
corporate author
editor
expert
interviewer
supervisor
translator
series variant title
title
translation of title
variant title
source
special issue
name of the institution
subject of form
subject of location
subject of time
subject term
series
series variant title
availibility
Open Access
category (general)
category (sub)
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
source
author
DOI
year of publication
location of publication
supervisor
category
publisher
classifier
conference location
quartile
availibility
subject term
title
series
name of the person
TTÜ subject term
TTÜ department
url
keyword
All fields
author
co-contibutor
commentator
compiler
corporate author
editor
expert
interviewer
supervisor
translator
series variant title
title
translation of title
variant title
source
special issue
name of the institution
subject of form
subject of location
subject of time
subject term
series
series variant title
availibility
Open Access
category (general)
category (sub)
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
source
author
DOI
year of publication
location of publication
supervisor
category
publisher
classifier
conference location
quartile
availibility
subject term
title
series
name of the person
TTÜ subject term
TTÜ department
url
keyword
All fields
author
co-contibutor
commentator
compiler
corporate author
editor
expert
interviewer
supervisor
translator
series variant title
title
translation of title
variant title
source
special issue
name of the institution
subject of form
subject of location
subject of time
subject term
series
series variant title
availibility
Open Access
category (general)
category (sub)
starts with
containes
exact match
—
Add criteria
Simple search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publication
..
year
year of publication
Loading..
author
Loading..
TTÜ department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
1
Look more..
(2/139)
Export
export all inquiry results
(1)
Save TXT fail
Save PDF fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
journal article
From virtual characterization to test-chips : DFM analysis through pattern enumeration
Martins, Mayler G.A.
;
Pagliarini, Samuel Nascimento
;
Isgenc, Mehmet Meric
;
Pileggi, Larry
IEEE transactions on computer-aided design of integrated circuits and systems
2020
/
p. 520-532
https://doi.org//10.1109/TCAD.2018.2889772
journal article
Number of records 1, displaying
1 - 1
keyword
137
1.
test-chips
2.
microprocessor chips
3.
modern system-on-chips (SoCs)
4.
multi-processor system-on-chips (MPSoCs)
5.
potato chips
6.
wood chips
7.
accelerated shelf-life test
8.
adaptive test strategy generation
9.
antigen test
10.
ASTM G65 dry sand rubber wheel abrasion test
11.
automated test environment
12.
automated test pattern generation
13.
automatic test case generation
14.
automatic test pattern generation
15.
automatic test program generation
16.
Auvergne test-bed
17.
battery test
18.
behavioral test
19.
behaviour level test generation
20.
bending test
21.
bit-error rate test
22.
Board and System Test
23.
board test
24.
bounds test
25.
built-in self-test
26.
capillary condensation redistribution test
27.
chi-square test
28.
closed bottle test
29.
cognitive screening test
30.
compartment fire test
31.
compartment test
32.
cone penetration test (CPT)
33.
COVID-19 antigen test
34.
cutting test
35.
cybersecurity test bed
36.
DDR4 interconnect test
37.
design and test
38.
design-for-test
39.
deterministic test sequences
40.
diagnostic test
41.
digital test
42.
Digital test and testable design
43.
double-pulse test
44.
drawing test
45.
dry droplet antimicrobial test
46.
embedded test
47.
fan pressurisation test
48.
final test result prediction
49.
four-point bending test
50.
FPGA based test
51.
FPGA-Assisted Test
52.
FPGA-centric test
53.
functional self-test
54.
functional test generation
55.
Granger causality test
56.
hardness test
57.
high-level synthesis for test
58.
high-level test data generation
59.
highlevel test generation
60.
high-speed serial link test
61.
IEEE 9 bus test system
62.
implementation-independent test generation
63.
in situ tensile test in SEM
64.
industrial field test
65.
in-situ tensile test in SEM
66.
Johansen cointegration test
67.
Kolmogorov-Smirnov test
68.
load test
69.
logic built-in self-test
70.
Luria alternating series test
71.
Mann–Kendall test
72.
memory interconnect test
73.
microprocessor test
74.
Model test
75.
multiplier test
76.
offline test generation
77.
orthogonal test
78.
package test analysis
79.
parallel design and test
80.
performance test
81.
piezocone penetration test (CPTu)
82.
Point Load Test index
83.
pressurisation test
84.
processor-centric board test
85.
progressive damage test
86.
provably correct test generation
87.
pseudo-exhaustive test
88.
purity test
89.
rtioco-based timed test sequences
90.
seasonal Mann Kendall test
91.
seismic piezocone penetration test
92.
self-test
93.
self-test architectures
94.
sentence writing test
95.
serial sevens test
96.
ship towing test tank
97.
similar material simulation test
98.
small‐scale test
99.
software based self-test
100.
software-based self-test
101.
software-based self-test (SBST)
102.
soil phosphorus (P) test
103.
standard test method
104.
static load test
105.
static-dynamic probing test (SDT)
106.
stress test
107.
system level test
108.
teaching design and test of systems
109.
tensile test
110.
test
111.
test and evaluation platform
112.
test bench
113.
test coverage
114.
test driven development
115.
test driven modelling
116.
test embankment
117.
test equipment
118.
test generation
119.
test generation and fault diagnosis
120.
test groups
121.
test model design
122.
test optimization
123.
test packets
124.
test path synthesis
125.
test patterns
126.
test point insertion
127.
test program generation
128.
test reference year
129.
test replication
130.
test scenario description language
131.
test-bed
132.
test-house
133.
test-pattern
134.
test-suite reduction
135.
Three-point bending test
136.
unit root test
137.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
×
vaste
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TTÜ department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TTÜ department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT