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journal article
From virtual characterization to test-chips : DFM analysis through pattern enumeration
Martins, Mayler G.A.
;
Pagliarini, Samuel Nascimento
;
Isgenc, Mehmet Meric
;
Pileggi, Larry
IEEE transactions on computer-aided design of integrated circuits and systems
2020
/
p. 520-532
https://doi.org//10.1109/TCAD.2018.2889772
journal article
Number of records 1, displaying
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keyword
149
1.
test-chips
2.
European Chips Act
3.
microprocessor chips
4.
modern system-on-chips (SoCs)
5.
multi-processor system-on-chips (MPSoCs)
6.
potato chips
7.
wood chips
8.
accelerated shelf-life test
9.
adaptive test strategy generation
10.
antigen test
11.
Applications in Test Engineering
12.
ASTM G65 dry sand rubber wheel abrasion test
13.
Automated Synthesis of Software-based Self-test
14.
automated test environment
15.
automated test pattern generation
16.
automatic test case generation
17.
automatic test pattern generation
18.
automatic test program generation
19.
Auvergne test-bed
20.
battery test
21.
behavioral test
22.
behaviour level test generation
23.
bending test
24.
bit-error rate test
25.
Board and System Test
26.
board test
27.
bounds test
28.
built-in self-test
29.
capillary condensation redistribution test
30.
chi-square test
31.
closed bottle test
32.
cognitive screening test
33.
compartment fire test
34.
compartment test
35.
cone penetration test (CPT)
36.
COVID-19 antigen test
37.
cutting test
38.
cybersecurity test bed
39.
DDR4 interconnect test
40.
design and test
41.
design-for-test
42.
deterministic test sequences
43.
diagnostic test
44.
digital test
45.
Digital test and testable design
46.
double-pulse test
47.
drawing test
48.
dry droplet antimicrobial test
49.
embedded test
50.
fan pressurisation test
51.
final test result prediction
52.
four-point bending test
53.
FPGA based test
54.
FPGA-Assisted Test
55.
FPGA-centric test
56.
functional self-test
57.
functional test generation
58.
Granger causality test
59.
hardness test
60.
Hierarchical Multi-level Test Generation
61.
high-level synthesis for test
62.
high-level test data generation
63.
highlevel test generation
64.
high-speed serial link test
65.
IEEE 9 bus test system
66.
implementation-independent test generation
67.
in situ tensile test in SEM
68.
industrial field test
69.
in-situ tensile test in SEM
70.
Johansen cointegration test
71.
Kolmogorov-Smirnov test
72.
load test
73.
logic built-in self-test
74.
Luria alternating series test
75.
Mann–Kendall test
76.
Mann-Kendall trend test
77.
memory interconnect test
78.
microprocessor test
79.
Model test
80.
multiplier test
81.
offline test generation
82.
orthogonal test
83.
package test analysis
84.
parallel design and test
85.
performance test
86.
piezocone penetration test (CPTu)
87.
Point Load Test index
88.
pressurisation test
89.
processor-centric board test
90.
progressive damage test
91.
provably correct test generation
92.
pseudo-exhaustive test
93.
purity test
94.
real-time room temperature test
95.
rolling thin film oven test
96.
rtioco-based timed test sequences
97.
seasonal Mann Kendall test
98.
seismic piezocone penetration test
99.
self-test
100.
self-test architectures
101.
sentence writing test
102.
serial sevens test
103.
ship towing test tank
104.
similar material simulation test
105.
small-scale fire test
106.
small‐scale test
107.
software based self-test
108.
software-based self-test
109.
software-based self-test (SBST)
110.
soil phosphorus (P) test
111.
standard test method
112.
static load test
113.
static-dynamic probing test (SDT)
114.
stress test
115.
system level test
116.
teaching design and test of systems
117.
tensile test
118.
tensile test
119.
test
120.
test and evaluation platform
121.
test automation
122.
test bench
123.
test coverage
124.
test driven development
125.
test driven modelling
126.
test embankment
127.
test equipment
128.
test generation
129.
test generation and fault diagnosis
130.
Test Group Generation for Detecting Multiple Faults
131.
test groups
132.
test model design
133.
test optimization
134.
test packets
135.
test path synthesis
136.
test patterns
137.
test point insertion
138.
test program generation
139.
test reference year
140.
test replication
141.
test scenario description language
142.
test-bed
143.
test-house
144.
test-pattern
145.
test-suite reduction
146.
Three-point bending test
147.
unit root test
148.
usability platform test
149.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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