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book article
Multiple control fault testing in digital systems with high-level decision diagrams
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 20th edition : 19th-21st May, Cluj-Napoca, Romania : proceedings
2016
/
[6] p. : ill
http://dx.doi.org/10.1109/AQTR.2016.7501287
book article
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keyword
211
1.
test optimization
2.
Bound Optimization BY Quadratic Approximation optimization algorithm
3.
African vultures optimization approach
4.
algorithm optimization
5.
ant colony optimization
6.
area optimization
7.
battery size optimization
8.
Bayesian optimization
9.
bi-level optimization
10.
biogeography based optimization
11.
bioprocess optimization
12.
budget optimization
13.
business process optimization
14.
circuit optimization
15.
Combinatorial optimization
16.
constrained constructive optimization
17.
control optimization
18.
convex optimization
19.
crest factor optimization
20.
Cut-off optimization
21.
daylight optimization
22.
decentralized optimization
23.
delay-aware optimization
24.
design optimization
25.
Economic optimization model
26.
efficiency optimization
27.
electric floor heating expenditure cost optimization
28.
energy optimization
29.
evolutionary optimization
30.
FEM/SEA optimization
31.
free size optimization
32.
global optimization techniques
33.
hyperparameter optimization
34.
inventory optimization
35.
investment optimization
36.
mathematical optimization
37.
medium optimization
38.
multicriteria optimization
39.
multi-criteria optimization
40.
multidisciplinary optimization
41.
Multihorizon optimization
42.
multi-objective optimization
43.
multi-objective optimization (MOO)
44.
multi-optimization
45.
nonlinear optimization
46.
optimization
47.
optimization (EMO)
48.
optimization algorithm
49.
optimization algorithms
50.
optimization component
51.
optimization methods
52.
optimization models
53.
optimization of resources
54.
optimization of the mechanical design
55.
optimization software
56.
optimization techniques
57.
optimization tools
58.
outdoor thermal comfort optimization
59.
Pareto optimization
60.
particle swarm optimization
61.
particle swarm optimization (PSO)
62.
PDE constrained optimization
63.
performance optimization
64.
power optimization
65.
pseudo-Boolean optimization
66.
pumping optimization
67.
reliability optimization
68.
Renewable energy optimization in buildings
69.
robust design optimization
70.
schedule optimization
71.
shape optimization
72.
simulation based static optimization
73.
Simultaneous model-based optimization
74.
stochastic optimization
75.
swarm intelligence optimization
76.
system optimization
77.
topology optimization
78.
trajectory optimization
79.
transport route optimization
80.
vehicle route optimization
81.
accelerated shelf-life test
82.
adaptive test strategy generation
83.
antigen test
84.
ASTM G65 dry sand rubber wheel abrasion test
85.
automated test environment
86.
automated test pattern generation
87.
automatic test case generation
88.
automatic test pattern generation
89.
automatic test program generation
90.
Auvergne test-bed
91.
battery test
92.
behavioral test
93.
behaviour level test generation
94.
bending test
95.
bit-error rate test
96.
Board and System Test
97.
board test
98.
bounds test
99.
built-in self-test
100.
capillary condensation redistribution test
101.
chi-square test
102.
closed bottle test
103.
cognitive screening test
104.
compartment fire test
105.
compartment test
106.
cone penetration test (CPT)
107.
COVID-19 antigen test
108.
cutting test
109.
cybersecurity test bed
110.
DDR4 interconnect test
111.
design and test
112.
design-for-test
113.
deterministic test sequences
114.
diagnostic test
115.
digital test
116.
Digital test and testable design
117.
double-pulse test
118.
drawing test
119.
dry droplet antimicrobial test
120.
embedded test
121.
fan pressurisation test
122.
final test result prediction
123.
four-point bending test
124.
FPGA based test
125.
FPGA-Assisted Test
126.
FPGA-centric test
127.
functional self-test
128.
functional test generation
129.
Granger causality test
130.
hardness test
131.
high-level synthesis for test
132.
high-level test data generation
133.
highlevel test generation
134.
high-speed serial link test
135.
IEEE 9 bus test system
136.
implementation-independent test generation
137.
in situ tensile test in SEM
138.
industrial field test
139.
in-situ tensile test in SEM
140.
Johansen cointegration test
141.
Kolmogorov-Smirnov test
142.
load test
143.
logic built-in self-test
144.
Luria alternating series test
145.
Mann–Kendall test
146.
memory interconnect test
147.
microprocessor test
148.
Model test
149.
multiplier test
150.
offline test generation
151.
orthogonal test
152.
package test analysis
153.
parallel design and test
154.
performance test
155.
piezocone penetration test (CPTu)
156.
Point Load Test index
157.
pressurisation test
158.
processor-centric board test
159.
progressive damage test
160.
provably correct test generation
161.
pseudo-exhaustive test
162.
purity test
163.
rtioco-based timed test sequences
164.
seasonal Mann Kendall test
165.
seismic piezocone penetration test
166.
self-test
167.
self-test architectures
168.
sentence writing test
169.
serial sevens test
170.
ship towing test tank
171.
similar material simulation test
172.
small‐scale test
173.
software based self-test
174.
software-based self-test
175.
software-based self-test (SBST)
176.
soil phosphorus (P) test
177.
standard test method
178.
static load test
179.
static-dynamic probing test (SDT)
180.
stress test
181.
system level test
182.
teaching design and test of systems
183.
tensile test
184.
test
185.
test and evaluation platform
186.
test bench
187.
test coverage
188.
test driven development
189.
test driven modelling
190.
test embankment
191.
test equipment
192.
test generation
193.
test generation and fault diagnosis
194.
test groups
195.
test model design
196.
test packets
197.
test path synthesis
198.
test patterns
199.
test point insertion
200.
test program generation
201.
test reference year
202.
test replication
203.
test scenario description language
204.
test-bed
205.
test-chips
206.
test-house
207.
test-pattern
208.
test-suite reduction
209.
Three-point bending test
210.
unit root test
211.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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