Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
multiplier test (keyword)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publication
..
year
year of publication
Loading..
author
Loading..
TTÜ department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
1
Look more..
(2/142)
Export
export all inquiry results
(1)
Save TXT fail
Save PDF fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
book article
Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cells
Azad, Siavoosh Payandeh
;
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings
2018
/
p. 21-26 : ill
https://doi.org/10.1109/DDECS.2018.00011
book article
Number of records 1, displaying
1 - 1
keyword
140
1.
multiplier test
2.
alternating direction multiplier method
3.
karatsuba multiplier
4.
lagrangian multiplier
5.
multiplier effect
6.
schoolbook multiplier
7.
toom cook multiplier
8.
voltage multiplier
9.
voltage multiplier cell
10.
accelerated shelf-life test
11.
adaptive test strategy generation
12.
antigen test
13.
ASTM G65 dry sand rubber wheel abrasion test
14.
automated test environment
15.
automated test pattern generation
16.
automatic test case generation
17.
automatic test pattern generation
18.
automatic test program generation
19.
Auvergne test-bed
20.
battery test
21.
behavioral test
22.
behaviour level test generation
23.
bending test
24.
bit-error rate test
25.
Board and System Test
26.
board test
27.
bounds test
28.
built-in self-test
29.
capillary condensation redistribution test
30.
chi-square test
31.
closed bottle test
32.
cognitive screening test
33.
compartment fire test
34.
compartment test
35.
cone penetration test (CPT)
36.
COVID-19 antigen test
37.
cutting test
38.
cybersecurity test bed
39.
DDR4 interconnect test
40.
design and test
41.
design-for-test
42.
deterministic test sequences
43.
diagnostic test
44.
digital test
45.
Digital test and testable design
46.
double-pulse test
47.
drawing test
48.
dry droplet antimicrobial test
49.
embedded test
50.
fan pressurisation test
51.
final test result prediction
52.
four-point bending test
53.
FPGA based test
54.
FPGA-Assisted Test
55.
FPGA-centric test
56.
functional self-test
57.
functional test generation
58.
Granger causality test
59.
hardness test
60.
high-level synthesis for test
61.
high-level test data generation
62.
highlevel test generation
63.
high-speed serial link test
64.
IEEE 9 bus test system
65.
implementation-independent test generation
66.
in situ tensile test in SEM
67.
industrial field test
68.
in-situ tensile test in SEM
69.
Johansen cointegration test
70.
Kolmogorov-Smirnov test
71.
load test
72.
logic built-in self-test
73.
Luria alternating series test
74.
Mann–Kendall test
75.
memory interconnect test
76.
microprocessor test
77.
Model test
78.
offline test generation
79.
orthogonal test
80.
package test analysis
81.
parallel design and test
82.
performance test
83.
piezocone penetration test (CPTu)
84.
Point Load Test index
85.
pressurisation test
86.
processor-centric board test
87.
progressive damage test
88.
provably correct test generation
89.
pseudo-exhaustive test
90.
purity test
91.
rtioco-based timed test sequences
92.
seasonal Mann Kendall test
93.
seismic piezocone penetration test
94.
self-test
95.
self-test architectures
96.
sentence writing test
97.
serial sevens test
98.
ship towing test tank
99.
similar material simulation test
100.
small‐scale test
101.
software based self-test
102.
software-based self-test
103.
software-based self-test (SBST)
104.
soil phosphorus (P) test
105.
standard test method
106.
static load test
107.
static-dynamic probing test (SDT)
108.
stress test
109.
system level test
110.
teaching design and test of systems
111.
tensile test
112.
test
113.
test and evaluation platform
114.
test bench
115.
test coverage
116.
test driven development
117.
test driven modelling
118.
test embankment
119.
test equipment
120.
test generation
121.
test generation and fault diagnosis
122.
test groups
123.
test model design
124.
test optimization
125.
test packets
126.
test path synthesis
127.
test patterns
128.
test point insertion
129.
test program generation
130.
test reference year
131.
test replication
132.
test scenario description language
133.
test-bed
134.
test-chips
135.
test-house
136.
test-pattern
137.
test-suite reduction
138.
Three-point bending test
139.
unit root test
140.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
×
vaste
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TTÜ department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TTÜ department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT