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book article

At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]Gorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, Mart31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers2013 / p. 1-6 : ill [USB]

book article
2

book article

Bringing research issues into lab scenarios on the example of SoC testing [Electronic resource]Ubar, Raimund-Johannes; Jutman, Artur; Devadze, Sergei; Wuttke, Heinz-DietrichInternational Conference on Engineering Education - ICEE 2007 : September 3-7, 2007, Coimbra, Portugal2007 / [7] p. : ill. [CD-ROM] http://icee2007.dei.uc.pt/proceedings/papers/429.pdf

book article
3

journal article

Functional self-test of high-performance pipe-lined signal processing architecturesGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, MartMicroprocessors and microsystems2015 / p. 909-918 : ill http://dx.doi.org/10.1016/j.micpro.2014.11.002

journal article
4

book article EST / book article ENG

Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentationOyeniran, Adeboye Stephen; Azad, Siavoosh Payandeh; Ubar, Raimund-Johannes2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings2018 / 5 p.: ill https://doi.org/10.1109/ISCAS.2018.8350936 Conference proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG
5

book article

Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cellsAzad, Siavoosh Payandeh; Oyeniran, Adeboye Stephen; Ubar, Raimund-Johannes21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings2018 / p. 21-26 : ill https://doi.org/10.1109/DDECS.2018.00011

book article
6

book article

Self-testing of pipe-lined signal processing architectures at-speedGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 25-28 : ill

book article
7

book article

A tool set for teaching design-for-testability of digital circuitsKostin, Sergei; Orasson, Elmet; Ubar, Raimund-JohannesEWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK2016 / [6] p. : ill https://doi.org/10.1109/EWME.2016.7496466

book article

Number of records 7, displaying 1 - 7

1. built-in self-test
2. logic built-in self-test
3. functional self-test
4. self-test
5. self-test architectures
6. software based self-test
7. software-based self-test
8. software-based self-test (SBST)
9. As-built
10. as-built model
11. as-built survey
12. built environment
13. built environment and architecture
14. built environment investment
15. built environment skills needs
16. built in moisture
17. built-in moisture
18. Built-in transformer (BIT)
19. cultural built heritage
20. hand-built pottery
21. sustainable built environment
22. adolescent self-efficacy
23. association of local-self government
24. association of local-self governments
25. corporate energy self-sufficiency
26. covalent self-assembly in solid state
27. diffusion and self-trapping of charge carriers
28. digital self-determination
29. digital self-efficacy
30. digital self-interference cancellation
31. European charter of local self-government
32. European self-sovereign identity framework
33. high strength self-compacting concrete
34. income of self-employed
35. increased self-consumption
36. local self-government
37. nikel-based self-fluxing alloy
38. NiP self-lubricating coating
39. open self‐ventilated machines
40. optical self-mixing
41. OSV (open self‐ventilated) machines
42. perceived general self-efficacy
43. renewables self-consumption
44. Self assessment tool
45. self aware
46. self learning software
47. self learning system
48. Self organization
49. self organizing map
50. self organizing network
51. self regulating heating
52. self regulation
53. self-analysis
54. self-assembled monolayers
55. self-assembly
56. self-assessed quality of life
57. self-assessment
58. self-assessment tool
59. self-aware
60. self-aware contracts
61. self-aware systems
62. self-awareness
63. self-checking
64. self-cleaning surfaces
65. self-consistent channels
66. self-consumption
67. self-costs
68. self-defence
69. self-determination
70. self-determination theory
71. self-determination theory of work motivation
72. self-development
73. self-driving car
74. self-driving cars
75. self-driving minibus
76. self-driving vehicle
77. self-driving vehicles
78. self-efficacy
79. self-efficacy development
80. self-employed
81. self-employment
82. self-evaluation
83. self-fluxing alloy
84. self-governance
85. self-healing
86. self-heating phenomenon
87. self-identification
88. self-identity
89. self-improvement
90. self-insurance
91. self-learning
92. self-lubrication
93. self-management
94. self‐management
95. self-mixing
96. self-organisation
97. self-organised teams
98. self-organization
99. self-organized criticality
100. self-organized teams
101. self-perforating dowel
102. self-propagating high temperature synthesized (SHS)
103. Self-Propagating High-Temperature Synthesis
104. self-propulsion
105. self-regulated learning
106. self-regulation
107. self-reported musculoskeletal disorders
108. self-rolling
109. self-shading envelopes
110. self-study
111. self-study courses
112. self-training
113. social self-development
114. accelerated shelf-life test
115. adaptive test strategy generation
116. antigen test
117. ASTM G65 dry sand rubber wheel abrasion test
118. automated test environment
119. automated test pattern generation
120. automatic test case generation
121. automatic test pattern generation
122. automatic test program generation
123. Auvergne test-bed
124. battery test
125. behavioral test
126. behaviour level test generation
127. bending test
128. bit-error rate test
129. Board and System Test
130. board test
131. bounds test
132. capillary condensation redistribution test
133. chi-square test
134. closed bottle test
135. cognitive screening test
136. compartment fire test
137. compartment test
138. cone penetration test (CPT)
139. COVID-19 antigen test
140. cutting test
141. cybersecurity test bed
142. DDR4 interconnect test
143. design and test
144. design-for-test
145. deterministic test sequences
146. diagnostic test
147. digital test
148. Digital test and testable design
149. double-pulse test
150. drawing test
151. dry droplet antimicrobial test
152. embedded test
153. fan pressurisation test
154. final test result prediction
155. four-point bending test
156. FPGA based test
157. FPGA-Assisted Test
158. FPGA-centric test
159. functional test generation
160. Granger causality test
161. hardness test
162. high-level synthesis for test
163. high-level test data generation
164. highlevel test generation
165. high-speed serial link test
166. IEEE 9 bus test system
167. implementation-independent test generation
168. in situ tensile test in SEM
169. industrial field test
170. in-situ tensile test in SEM
171. Johansen cointegration test
172. Kolmogorov-Smirnov test
173. load test
174. Luria alternating series test
175. Mann–Kendall test
176. memory interconnect test
177. microprocessor test
178. Model test
179. multiplier test
180. offline test generation
181. orthogonal test
182. package test analysis
183. parallel design and test
184. performance test
185. piezocone penetration test (CPTu)
186. Point Load Test index
187. pressurisation test
188. processor-centric board test
189. progressive damage test
190. provably correct test generation
191. pseudo-exhaustive test
192. purity test
193. rolling thin film oven test
194. rtioco-based timed test sequences
195. seasonal Mann Kendall test
196. seismic piezocone penetration test
197. sentence writing test
198. serial sevens test
199. ship towing test tank
200. similar material simulation test
201. small-scale fire test
202. small‐scale test
203. soil phosphorus (P) test
204. standard test method
205. static load test
206. static-dynamic probing test (SDT)
207. stress test
208. system level test
209. teaching design and test of systems
210. tensile test
211. test
212. test and evaluation platform
213. test automation
214. test bench
215. test coverage
216. test driven development
217. test driven modelling
218. test embankment
219. test equipment
220. test generation
221. test generation and fault diagnosis
222. test groups
223. test model design
224. test optimization
225. test packets
226. test path synthesis
227. test patterns
228. test point insertion
229. test program generation
230. test reference year
231. test replication
232. test scenario description language
233. test-bed
234. test-chips
235. test-house
236. test-pattern
237. test-suite reduction
238. Three-point bending test
239. unit root test
240. usability platform test
241. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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