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built-in self-test (keyword)
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1
book article
At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
;
Devadze, Sergei
;
Raik, Jaan
;
Min, Mart
31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers
2013
/
p. 1-6 : ill [USB]
book article
2
book article
Bringing research issues into lab scenarios on the example of SoC testing [Electronic resource]
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Devadze, Sergei
;
Wuttke, Heinz-Dietrich
International Conference on Engineering Education - ICEE 2007 : September 3-7, 2007, Coimbra, Portugal
2007
/
[7] p. : ill. [CD-ROM]
http://icee2007.dei.uc.pt/proceedings/papers/429.pdf
book article
3
journal article
Functional self-test of high-performance pipe-lined signal processing architectures
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
;
Devadze, Sergei
;
Raik, Jaan
;
Min, Mart
Microprocessors and microsystems
2015
/
p. 909-918 : ill
http://dx.doi.org/10.1016/j.micpro.2014.11.002
journal article
4
book article EST
/
book article ENG
Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentation
Oyeniran, Adeboye Stephen
;
Azad, Siavoosh Payandeh
;
Ubar, Raimund-Johannes
2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings
2018
/
5 p.: ill
https://doi.org/10.1109/ISCAS.2018.8350936
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
5
book article
Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cells
Azad, Siavoosh Payandeh
;
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings
2018
/
p. 21-26 : ill
https://doi.org/10.1109/DDECS.2018.00011
book article
6
book article
Self-testing of pipe-lined signal processing architectures at-speed
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu
2013
/
p. 25-28 : ill
book article
7
book article
A tool set for teaching design-for-testability of digital circuits
Kostin, Sergei
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
EWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK
2016
/
[6] p. : ill
https://doi.org/10.1109/EWME.2016.7496466
book article
Number of records 7, displaying
1 - 7
keyword
230
1.
built-in self-test
2.
logic built-in self-test
3.
functional self-test
4.
self-test
5.
self-test architectures
6.
software based self-test
7.
software-based self-test
8.
software-based self-test (SBST)
9.
As-built
10.
built environment
11.
built environment and architecture
12.
built environment investment
13.
built environment skills needs
14.
built in moisture
15.
built-in moisture
16.
Built-in transformer (BIT)
17.
cultural built heritage
18.
sustainable built environment
19.
adolescent self-efficacy
20.
association of local-self government
21.
association of local-self governments
22.
corporate energy self-sufficiency
23.
covalent self-assembly in solid state
24.
diffusion and self-trapping of charge carriers
25.
digital self-determination
26.
digital self-efficacy
27.
digital self-interference cancellation
28.
European charter of local self-government
29.
European self-sovereign identity framework
30.
income of self-employed
31.
increased self-consumption
32.
local self-government
33.
nikel-based self-fluxing alloy
34.
NiP self-lubricating coating
35.
open self‐ventilated machines
36.
optical self-mixing
37.
OSV (open self‐ventilated) machines
38.
perceived general self-efficacy
39.
Self assessment tool
40.
self aware
41.
self learning software
42.
self learning system
43.
Self organization
44.
self organizing map
45.
self organizing network
46.
self regulating heating
47.
self regulation
48.
self-analysis
49.
self-assembled monolayers
50.
self-assembly
51.
self-assessed quality of life
52.
self-assessment
53.
self-assessment tool
54.
self-aware contracts
55.
self-aware systems
56.
self-awareness
57.
self-checking
58.
self-cleaning surfaces
59.
self-consumption
60.
self-costs
61.
self-defence
62.
self-determination
63.
self-determination theory
64.
self-determination theory of work motivation
65.
self-development
66.
self-driving car
67.
self-driving cars
68.
self-driving minibus
69.
self-driving vehicle
70.
self-driving vehicles
71.
self-efficacy
72.
self-efficacy development
73.
self-employed
74.
self-employment
75.
self-evaluation
76.
self-fluxing alloy
77.
self-governance
78.
self-healing
79.
self-heating phenomenon
80.
self-identification
81.
self-identity
82.
self-improvement
83.
self-insurance
84.
self-learning
85.
self-lubrication
86.
self-management
87.
self‐management
88.
self-mixing
89.
self-organisation
90.
self-organised teams
91.
self-organization
92.
self-organized criticality
93.
self-organized teams
94.
self-perforating dowel
95.
self-propagating high temperature synthesized (SHS)
96.
Self-Propagating High-Temperature Synthesis
97.
self-propulsion
98.
self-regulated learning
99.
self-regulation
100.
self-reported musculoskeletal disorders
101.
self-rolling
102.
self-shading envelopes
103.
self-study
104.
self-study courses
105.
self-training
106.
social self-development
107.
accelerated shelf-life test
108.
adaptive test strategy generation
109.
antigen test
110.
ASTM G65 dry sand rubber wheel abrasion test
111.
automated test environment
112.
automated test pattern generation
113.
automatic test case generation
114.
automatic test pattern generation
115.
automatic test program generation
116.
Auvergne test-bed
117.
battery test
118.
behavioral test
119.
behaviour level test generation
120.
bending test
121.
bit-error rate test
122.
Board and System Test
123.
board test
124.
bounds test
125.
capillary condensation redistribution test
126.
chi-square test
127.
closed bottle test
128.
cognitive screening test
129.
compartment fire test
130.
compartment test
131.
cone penetration test (CPT)
132.
COVID-19 antigen test
133.
cutting test
134.
cybersecurity test bed
135.
DDR4 interconnect test
136.
design and test
137.
design-for-test
138.
deterministic test sequences
139.
diagnostic test
140.
digital test
141.
Digital test and testable design
142.
double-pulse test
143.
drawing test
144.
dry droplet antimicrobial test
145.
embedded test
146.
fan pressurisation test
147.
final test result prediction
148.
four-point bending test
149.
FPGA based test
150.
FPGA-Assisted Test
151.
FPGA-centric test
152.
functional test generation
153.
Granger causality test
154.
hardness test
155.
high-level synthesis for test
156.
high-level test data generation
157.
highlevel test generation
158.
high-speed serial link test
159.
IEEE 9 bus test system
160.
implementation-independent test generation
161.
in situ tensile test in SEM
162.
industrial field test
163.
in-situ tensile test in SEM
164.
Johansen cointegration test
165.
Kolmogorov-Smirnov test
166.
load test
167.
Luria alternating series test
168.
Mann–Kendall test
169.
memory interconnect test
170.
microprocessor test
171.
Model test
172.
multiplier test
173.
offline test generation
174.
orthogonal test
175.
package test analysis
176.
parallel design and test
177.
performance test
178.
piezocone penetration test (CPTu)
179.
Point Load Test index
180.
pressurisation test
181.
processor-centric board test
182.
progressive damage test
183.
provably correct test generation
184.
pseudo-exhaustive test
185.
purity test
186.
rtioco-based timed test sequences
187.
seasonal Mann Kendall test
188.
seismic piezocone penetration test
189.
sentence writing test
190.
serial sevens test
191.
ship towing test tank
192.
similar material simulation test
193.
small‐scale test
194.
soil phosphorus (P) test
195.
standard test method
196.
static load test
197.
static-dynamic probing test (SDT)
198.
stress test
199.
system level test
200.
teaching design and test of systems
201.
tensile test
202.
test
203.
test and evaluation platform
204.
test bench
205.
test coverage
206.
test driven development
207.
test driven modelling
208.
test embankment
209.
test equipment
210.
test generation
211.
test generation and fault diagnosis
212.
test groups
213.
test model design
214.
test optimization
215.
test packets
216.
test path synthesis
217.
test patterns
218.
test point insertion
219.
test program generation
220.
test reference year
221.
test replication
222.
test scenario description language
223.
test-bed
224.
test-chips
225.
test-house
226.
test-pattern
227.
test-suite reduction
228.
Three-point bending test
229.
unit root test
230.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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