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test path synthesis (keyword)
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book article
Automatic SoC level test path synthesis based on partial functional models
Tšertov, Anton
;
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Devadze, Sergei
2011 Asian Test Symposium (ATS) : New Delhi, India
2011
/
p. 532-538
https://ieeexplore.ieee.org/document/6114730
book article
Number of records 1, displaying
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keyword
215
1.
test path synthesis
2.
high-level synthesis for test
3.
control and data path tests
4.
critical path
5.
critical path fault tracing
6.
critical path identification
7.
critical path method
8.
critical path tracing
9.
deformation path
10.
development path
11.
fault simulation with critical path tracing
12.
feasible path generation
13.
helical path separation
14.
human path rehabilitation
15.
mean free path
16.
minimal path
17.
multi-path
18.
NBTI-critical path
19.
NBTI-induced path delay estimation
20.
path analyses
21.
path dependency
22.
path identification
23.
path loss model
24.
path planning
25.
reaction path
26.
shortest path
27.
shortest-path
28.
timing-critical path
29.
tracking path
30.
asymmetric synthesis
31.
automatic program synthesis
32.
behavioral synthesis
33.
chemical synthesis
34.
chemoenzymatic synthesis
35.
circuit synthesis
36.
combustion synthesis
37.
control system synthesis
38.
counterexample-guided inductive synthesis
39.
data synthesis
40.
diversity-oriented synthesis
41.
enantioselective synthesis
42.
evidence synthesis
43.
flame aerosol synthesis
44.
green synthesis
45.
green synthesis biomaterials
46.
growth-synthesis
47.
high level synthesis
48.
high-level decision diagrams (HLDD) synthesis
49.
High-Level Synthesis (HLS)
50.
highly chemoselective synthesis
51.
hydrothermal synthesis
52.
in situ synthesis
53.
logic synthesis
54.
low temperature synthesis
55.
mechanically activated synthesis
56.
mechanically activated thermal synthesis
57.
microwave assisted synthesis
58.
microwave synthesis
59.
microwave-assisted synthesis
60.
molten salt synthesis
61.
molten salt synthesis-growth
62.
nano-crystal synthesis
63.
nanomaterials, synthesis
64.
Nanoparticle synthesis
65.
organic synthesis
66.
parameter synthesis
67.
peroxide synthesis
68.
pigment synthesis
69.
Protecting-group-free synthesis
70.
protein synthesis
71.
Realist synthesis
72.
Self-Propagating High-Temperature Synthesis
73.
semi-synthesis
74.
signal synthesis
75.
sol-gel synthesis
76.
solution based synthesis
77.
solution combustion synthesis
78.
stereoselective synthesis
79.
synthesis
80.
synthesis gas
81.
synthesis of intermetallic phases
82.
synthesis on hierarchical service models
83.
template synthesis
84.
total synthesis
85.
wet-combustion synthesis
86.
accelerated shelf-life test
87.
adaptive test strategy generation
88.
antigen test
89.
ASTM G65 dry sand rubber wheel abrasion test
90.
automated test environment
91.
automated test pattern generation
92.
automatic test case generation
93.
automatic test pattern generation
94.
automatic test program generation
95.
Auvergne test-bed
96.
battery test
97.
behavioral test
98.
behaviour level test generation
99.
bending test
100.
bit-error rate test
101.
Board and System Test
102.
board test
103.
bounds test
104.
built-in self-test
105.
capillary condensation redistribution test
106.
chi-square test
107.
closed bottle test
108.
cognitive screening test
109.
compartment fire test
110.
compartment test
111.
cone penetration test (CPT)
112.
COVID-19 antigen test
113.
cutting test
114.
cybersecurity test bed
115.
DDR4 interconnect test
116.
design and test
117.
design-for-test
118.
deterministic test sequences
119.
diagnostic test
120.
digital test
121.
Digital test and testable design
122.
double-pulse test
123.
drawing test
124.
dry droplet antimicrobial test
125.
embedded test
126.
fan pressurisation test
127.
final test result prediction
128.
four-point bending test
129.
FPGA based test
130.
FPGA-Assisted Test
131.
FPGA-centric test
132.
functional self-test
133.
functional test generation
134.
Granger causality test
135.
hardness test
136.
high-level test data generation
137.
highlevel test generation
138.
high-speed serial link test
139.
IEEE 9 bus test system
140.
implementation-independent test generation
141.
in situ tensile test in SEM
142.
industrial field test
143.
in-situ tensile test in SEM
144.
Johansen cointegration test
145.
Kolmogorov-Smirnov test
146.
load test
147.
logic built-in self-test
148.
Luria alternating series test
149.
Mann–Kendall test
150.
memory interconnect test
151.
microprocessor test
152.
Model test
153.
multiplier test
154.
offline test generation
155.
orthogonal test
156.
package test analysis
157.
parallel design and test
158.
performance test
159.
piezocone penetration test (CPTu)
160.
Point Load Test index
161.
pressurisation test
162.
processor-centric board test
163.
progressive damage test
164.
provably correct test generation
165.
pseudo-exhaustive test
166.
purity test
167.
rtioco-based timed test sequences
168.
seasonal Mann Kendall test
169.
seismic piezocone penetration test
170.
self-test
171.
self-test architectures
172.
sentence writing test
173.
serial sevens test
174.
ship towing test tank
175.
similar material simulation test
176.
small‐scale test
177.
software based self-test
178.
software-based self-test
179.
software-based self-test (SBST)
180.
soil phosphorus (P) test
181.
standard test method
182.
static load test
183.
static-dynamic probing test (SDT)
184.
stress test
185.
system level test
186.
teaching design and test of systems
187.
tensile test
188.
test
189.
test and evaluation platform
190.
test bench
191.
test coverage
192.
test driven development
193.
test driven modelling
194.
test embankment
195.
test equipment
196.
test generation
197.
test generation and fault diagnosis
198.
test groups
199.
test model design
200.
test optimization
201.
test packets
202.
test patterns
203.
test point insertion
204.
test program generation
205.
test reference year
206.
test replication
207.
test scenario description language
208.
test-bed
209.
test-chips
210.
test-house
211.
test-pattern
212.
test-suite reduction
213.
Three-point bending test
214.
unit root test
215.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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