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teaching design and test of systems (keyword)
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book article
Environment for innovative university research training in the field of digital test
Oyeniran, Adeboye Stephen
;
Ademilua, Tolulope
;
Kruus, Margus
;
Ubar, Raimund-Johannes
2021 30th Annual Conference of the European Association for Education in Electrical and Information Engineering (EAEEIE)
2021
https://doi.org/10.1109/EAEEIE50507.2021.9531003
book article
Number of records 1, displaying
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keyword
185
1.
teaching design and test of systems
2.
design and test
3.
design-for-test
4.
Digital test and testable design
5.
parallel design and test
6.
test model design
7.
control systems design
8.
design and implementation of Performance Management Systems
9.
design support systems
10.
nanoelectronic systems design
11.
nano-electronic systems design
12.
design methodology and human-centred design
13.
chemistry teaching
14.
classroom teaching
15.
computer-aided teaching
16.
conception of teaching
17.
coping with online teaching and learning
18.
designing a teaching model
19.
digital teaching
20.
digital teaching tool
21.
effective teaching
22.
effective teaching and learning
23.
effective teaching engineering
24.
entrepreneurial teaching and learning
25.
higher education teaching
26.
Hybrid teaching
27.
integrative teaching method
28.
interactive teaching methods
29.
learning by teaching
30.
logic teaching
31.
mastery teaching
32.
online teaching
33.
practical teaching methods
34.
remote teaching
35.
research oriented teaching
36.
robot-assisted teaching
37.
scholarship of teaching and learning
38.
teaching
39.
teaching best practices
40.
teaching case
41.
teaching challenges
42.
teaching commons
43.
teaching competencies
44.
teaching concept
45.
teaching engineering
46.
teaching engineering ethics
47.
teaching experience
48.
teaching factory
49.
teaching materials
50.
teaching methodology
51.
teaching methods
52.
teaching model
53.
teaching models
54.
teaching of informatics
55.
teaching strategies
56.
teaching strategy
57.
teaching supply chain management
58.
tools for interactive learning and teaching
59.
web-based teaching
60.
accelerated shelf-life test
61.
adaptive test strategy generation
62.
antigen test
63.
ASTM G65 dry sand rubber wheel abrasion test
64.
automated test environment
65.
automated test pattern generation
66.
automatic test case generation
67.
automatic test pattern generation
68.
automatic test program generation
69.
Auvergne test-bed
70.
battery test
71.
behavioral test
72.
behaviour level test generation
73.
bending test
74.
bit-error rate test
75.
Board and System Test
76.
board test
77.
bounds test
78.
built-in self-test
79.
capillary condensation redistribution test
80.
chi-square test
81.
closed bottle test
82.
cognitive screening test
83.
compartment fire test
84.
compartment test
85.
cone penetration test (CPT)
86.
COVID-19 antigen test
87.
cutting test
88.
cybersecurity test bed
89.
DDR4 interconnect test
90.
deterministic test sequences
91.
diagnostic test
92.
digital test
93.
double-pulse test
94.
drawing test
95.
dry droplet antimicrobial test
96.
embedded test
97.
fan pressurisation test
98.
final test result prediction
99.
four-point bending test
100.
FPGA based test
101.
FPGA-Assisted Test
102.
FPGA-centric test
103.
functional self-test
104.
functional test generation
105.
Granger causality test
106.
hardness test
107.
high-level synthesis for test
108.
high-level test data generation
109.
highlevel test generation
110.
high-speed serial link test
111.
IEEE 9 bus test system
112.
implementation-independent test generation
113.
in situ tensile test in SEM
114.
industrial field test
115.
in-situ tensile test in SEM
116.
Johansen cointegration test
117.
Kolmogorov-Smirnov test
118.
load test
119.
logic built-in self-test
120.
Luria alternating series test
121.
Mann–Kendall test
122.
memory interconnect test
123.
microprocessor test
124.
Model test
125.
multiplier test
126.
offline test generation
127.
orthogonal test
128.
package test analysis
129.
performance test
130.
piezocone penetration test (CPTu)
131.
Point Load Test index
132.
pressurisation test
133.
processor-centric board test
134.
progressive damage test
135.
provably correct test generation
136.
pseudo-exhaustive test
137.
purity test
138.
rtioco-based timed test sequences
139.
seasonal Mann Kendall test
140.
seismic piezocone penetration test
141.
self-test
142.
self-test architectures
143.
sentence writing test
144.
serial sevens test
145.
ship towing test tank
146.
similar material simulation test
147.
small‐scale test
148.
software based self-test
149.
software-based self-test
150.
software-based self-test (SBST)
151.
soil phosphorus (P) test
152.
standard test method
153.
static load test
154.
static-dynamic probing test (SDT)
155.
stress test
156.
system level test
157.
tensile test
158.
test
159.
test and evaluation platform
160.
test bench
161.
test coverage
162.
test driven development
163.
test driven modelling
164.
test embankment
165.
test equipment
166.
test generation
167.
test generation and fault diagnosis
168.
test groups
169.
test optimization
170.
test packets
171.
test path synthesis
172.
test patterns
173.
test point insertion
174.
test program generation
175.
test reference year
176.
test replication
177.
test scenario description language
178.
test-bed
179.
test-chips
180.
test-house
181.
test-pattern
182.
test-suite reduction
183.
Three-point bending test
184.
unit root test
185.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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